Ion beam analysis Adsorption Isotherms PIXE Rutherford backscattering spectrometry RBS Pulsed laser deposition HfO2 Oxidation Silicon carbide EPR Nanostructures ADSORPTION DESORPTION HYSTERESIS Zinc oxide Energy loss Adsorption Silicon Defects 2H Nuclear resonance profiling NRP NRA Channeling SiC X-ray diffraction Magnetic semiconductors Gold Epitaxial growth Ion implantation Pb centers Alloys NRP 27Alda Topological insulators GaMnAs 17Op 7630Lh Aluminum Multilayer Acoustic 27Ald p&α Adsorbed layers 18O Ageing 7550Pp Transparent conductive oxide TCO Evaluation Indium oxide 17Opp Periodic multilayer Acoustic propreties of solid AC susceptibility 17O 13C Sputtering Growth Epitaxy RBS Atomic Layer Deposition ALD Nanoparticles Measurement Topological defects Nuclear reaction analysis Annealing AFM ALD Low energy electron diffraction LEED Magnetization curves Oxygen deficiency Silicon Carbide Isotopic Tracing 8140Ef Nickel Nitridation Aluminium Magnetic anisotropy Thin films Al2O3 3C-SiC Kossel diffraction Ferromagnetic resonance 6855Jk Capillary condensation Density functional theory XRD Passivation Charge exchange Interface defects Auger electron spectroscopy AES 7550Ee Hysteresis Gallium oxide Stable isotopic tracing XPS 27Aldp Diffusion Photoluminescence 15N Silica Thin film Metal-insulator transition Raman spectroscopy 18O resonance